GigaDevice Innovation obtained a patent for “delay test circuit and probe structure”
GigaDevice Innovation Technology Group Co., Ltd. recently obtained a utility model patent authorization called “Delay Test Circuit and Probe Structure” (Grant Announcement No.: CN222167160U, Authorization Announcement Date: December 13, 2024, Application Date: March 5, 2024).
This patented technology belongs to the semiconductor field and provides a new type of time-lapse test circuit and probe structure. The circuit contains two parallel test branches, each receiving the same excitation signal and outputting their respective oscillation signals. A phase detector is used to detect the phase difference between these two output signals, allowing for precise detection of phase and frequency differences in the AC signals output by the two test legs. This technological innovation will help improve the precision and efficiency of semiconductor testing.
The above is the detailed content of GigaDevice’s “delay test circuit and probe structure” patent authorization, for more information, please pay attention to other related articles on PHP Chinese website!
